Distributor/Agen Resmi Transcom Instruments Indonesia
T5230A/T5215 - Vector Network Analyzer
T5230A/T5215A is a high performance VNA, large frequency range, large dynamic range ,low Noise level, low trace noise, it can be widely used for microwave device measurement in wireless communication, broadcast, TV device, radar device and semiconductor.
● Large frequency range:300kHz to 3GHz（T5230A）, 300kHz to 1.5GHz（T5215A）
● Large dynamic range:>125dB（IFBW=10Hz）,130dB typ.
● Low noise level: <-120dBm（IFBW=10Hz）
● Low trace noise: 1mdB rms（IFBW=3kHz）
● High measurement speed:125μs/point（IFBW=30kHz）
● High effective directivity:>45dB
● Remote Control: LAN/GPIB/USB
● Very low power consumption
● “One-key-test” solution
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Measurement Range
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Impedance
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50Ω,75Ω（1）
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Test port connector
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N-type, female
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Number of test ports
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2
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Frequency range
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300kHz to 3GHz/1.5GHZ(T5230A/T5215A)
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Full CW frequency accuracy
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±5×10-6
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Frequency resolution
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1Hz
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Number of measurement points
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2 to 10001
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Measurement bandwidths
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1Hz to 30kHz (with 1/1.5/2/3/5/7 steps)
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Dynamic range (IF bandwidth 10 Hz)
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125dB, typ.130dB
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(1)use 75Ωconnectors via adapters
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Measurement Speed
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Measurement time per point
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125μs
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Source to receiver port switchover time
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＜10ms
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Typical sweep times versus number of measurement points（IFBW 30kHz）
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51
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201
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401
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1601
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Uncorrected（Start 300 kHz, stop 10 MHz）
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13ms
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52ms
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104ms
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413ms
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Full two-port calibration（Start 300 kHz, stop 10 MHz）
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46ms
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123ms
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226ms
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844ms
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Uncorrected（Start 10 MHz, stop 3 GHz）
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7ms
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27ms
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53ms
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207ms
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Full two-port calibration（Start 10 MHz, stop 3 GHz）
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34ms
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73ms
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125ms
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434ms
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Measurement Accuracy
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Accuracy of transmission measurements (magnitude / phase)
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+15dB to + 5dB
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0.2dB/2º
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+ 5dB to -50dB
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0.1dB/1º
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-50dB to -70dB
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0.2dB/2º
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-70dB to -90dB
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1.0dB/6º
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Accuracy of reflection measurements (magnitude / phase)
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0dB ～ -15dB
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0.4dB/4º
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-15dB ～ -25dB
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1.5dB/7º
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-25dB ～ -35dB
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4.0dB/22º
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Trace stability
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Trace noise magnitude (IF bandwidth 3 kHz)
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1mdB rms
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Temperature dependence (per one degree of temperature variation)
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0.02dB
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Effective System Data1
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Effective directivity
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45 dB
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Effective source match
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40 dB
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Effective load match
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45 dB
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1applies
over the temperature range of 23°C ± 5 °C after 40 minutes of
warming-up, with less than 1 °C deviation from the full two-port
calibration temperature, at output power of -5 dBm, and IF bandwidth 10
Hz.
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Test Port Output
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Match (without system error correction)
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15 dB
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Power range
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-55dBm to +10dBm
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Power accuracy
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±1.0dB
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Power resolution
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0.05dB
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Harmonics distortion
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＜-30dBc
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Non harmonics distortion
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＜-30dBc
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Test Port Input
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Match (without system error correction)
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25 dB
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Damage level
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+26dBm
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Damage DC voltage
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+35V
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Noise level (IF bandwidth 10 Hz)
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＜-120dBm
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Measurement Capabilities
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Measured parameters
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S11,S21,S12,S22
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Number of measurement channels
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Up to 16 independent
logical channels. Each logical channel is represented on the screen as
an individual channel window. A logical channel is defined by such
stimulus signal settings as frequency range,number of test points, power
level, etc.
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Data traces
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Up to 16 data traces
can be displayed in each channel window. A data trace represents one of
such parameters of the DUT as S-parameters,
Response in time domain, input power response.
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Memory traces
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Each of the 16 data traces can be saved into memory for further comparison with the current values.
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Data display formats
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Logarithmic
magnitude, linear magnitude, phase, expanded phase, group delay, SWR,
real part, imaginary part, Smith chart diagram and polar diagram.
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Sweep Features
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Measured points per sweep
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Set by the user from 2 to 10001.
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Sweep type
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Linear frequency
sweep, logarithmic frequency sweep, and segment frequency sweep, when
the stimulus power is a fixed value; and linear power sweep when
frequency is a fixed value.
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Segment sweep features
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A frequency sweep
within several independent user-defined segments. Frequency range,
number of sweep points, source power, and IF bandwidth should be set for
each segment.
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Power
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Source power from –55
dBm to +10 dBm with resolution of 0.05 dB. In frequency sweep mode the
power slope can be set to up to 2 dB/GHz for compensation of high
frequency attenuation in connection wires.
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Sweep trigger
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Trigger modes: continuous, single, hold. Trigger sources: internal, manual, external.
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Trace Functions
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Trace display
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Data trace, memory trace, or simultaneous indication of data and memory traces.
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Trace math
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Data trace
modification by math operations: addition, subtraction, multiplication
or division of measured complex values and memory data.
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Autoscaling
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Automatic selection of scale division and reference level value to have the trace most effectively displayed.
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Electrical delay
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Calibration plane
moving to compensate for the delay in low-loss test setup.Compensation
for electrical delay in a DUT during measurements of deviation from
linear phase.
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Phase offset
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Phase offset defined in degrees.
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Statistics
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Caculation and display of mean, standard deviation, and peak-to-peak deviation for a data trace.
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Accuracy Enhancement
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Calibration
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Calibration of a test
setup (which includes the Analyzer, cables, and adapters)significantly
increases the accuracy of measurements. Calibration allows for
correction of the errors caused by imperfections in the measurement
system: system directivity, source and load match, tracking and
isolation.
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Calibration methods
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Calibration methods
of various sophistication and accuracy enhancement level are available.
The most accurate among them are full one-port calibration and full
two-port calibration.
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Reflection and transmission normalization
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Magnitude and phase correction of frequency response errors for reflection or transmission measurements.
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Full one-port calibration
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Magnitude and phase
correction of frequency response, correction of directivity, and source
match errors for one-port reflection measurements.
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One-path two-port calibration
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Performed for
reflection and one-way transmission measurements. Similar to one port
calibration for reflection measurements. Magnitude and phase correction
of frequency response, and correction of source match errors for
transmission measurements.
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Full two-port calibration
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Performed for full
S-parameter matrix measurement of a DUT. Magnitude and phase correction
of frequency response for reflection and transmission measurements,
correction of directivity, source match, load match, and isolation.
Isolation calibration can be omitted.
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Directivity calibration (optional)
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Correction of directivity additionally to reflection normalization.
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Isolation calibration (optional)
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Correction of isolation additionally to transmission normalization, one-path two-port calibration, or full two-port calibration.
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Error correction interpolation
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When the user changes
such settings as start/stop frequencies and number of sweep points,
compared to the settings at the moment of calibration, interpolation or
extrapolation of the calibration coefficients will be applied.
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Marker Functions
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Data markers
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Up to 16 markers for
each trace. Reference marker available for delta marker operation. Smith
chart diagram supports 5 marker formats: linear magnitude/phase, log
magnitude/phase, real/ imaginary, R + jX and G + jB. Polar diagram
supports 3 marker formats: linear magnitude/phase, log magnitude/phase,
and real/imaginary.
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Reference marker
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Enables indication of any maker values as relative to the reference marker.
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Marker search
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Search for max, min, peak, or target values on a trace.
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Marker search additional features
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User-definable search range. Functions of specific condition tracking or single operation search.
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Setting parameters by markers
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Setting of start,
stop and center frequencies by the stimulus value of the marker and
setting of reference level by the response value of the marker.
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Marker math functions
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Statistics, bandwidth.
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Statistics
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Calculation and display of mean, standard deviation and peak-to-peak in a frequency range limited by two markers on a trace.
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Bandwidth
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Determines bandwidth
between cutoff frequency points for an active marker or absolute
maximum. The bandwidth value, center frequency, lower frequency, higher
frequency, Q value, and insertion loss are displayed.
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Data Analysis
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Port impedance conversion
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The function of
conversion of the S-parameters measured at 50 Ω port into the values,
which could be determined if measured at a test port with arbitrary
impedance.
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De-embedding
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The function allows
to mathematically exclude from the measurement result the effect of the
fixture circuit connected between the calibration plane and the DUT.
This circuit should be described by an S-parameter matrix in a
Touchstone file.
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Embedding
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The function allows
to mathematically simulate the DUT parameters after virtual integration
of a fixture circuit between the calibration plane and the DUT. This
circuit should be described by an S-parameter matrix in a Touchstone
file.
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S-parameter conversion
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The function allows
conversion of the measured S-parameters to the following parameters:
reflection impedance and admittance, transmission impedance and
admittance, and inverse S-parameters.
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Time domain transformation
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The function performs
data transformation from frequency domain into response of the DUT to
various stimulus types in time domain. Modeled stimulus types: bandpass,
lowpass impulse, and lowpass step. Time domain span is set by the user
arbitrarily from zero to maximum, which is determined by the frequency
step. Windows of various forms are used for better tradeoff between
resolution and level of spurious sidelobes.
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Time domain gating
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The function
mathematically removes unwanted responses in time domain what allows for
obtaining frequency response without influence from the fixture
elements. The function applies reverse transformation back to frequency
domain after cutting out the user-defined span in time domain. Gating
filter types: bandpass or notch. For better tradeoff between gate
resolution and level of spurious sidelobes the following filter shapes
are available: maximum, wide, normal and minimum.
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Limit Test
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The limit test is a
function to perform the pass/fail judgment based on the limit line you
set with the limit table. In the limit test, if the upper limit or lower
limit indicated by the limit line is not exceeded, the judgment result
is pass; if it is exceeded, the judgment result is fail for all
measurement points on the trace. Measurement points in the stimulus
range with no limit line are judged as pass.
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Ripple Test
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The ripple test is a
function for evaluating the results on a pass/fail basis based on the
ripple limit, which is set using the ripple limit table. You can specify
up to 12 frequency bands, which permits a test for each frequency band.
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General Data
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Operating temperature range
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+5℃ to +40℃
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Storage temperature range
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-45℃ to +55℃
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Humidity
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90% （25℃）
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Atmospheric pressure
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84 to 106.7 kPa
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Calibration interval
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3 years
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Power supply
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220 ± 22 V (AC), 50 Hz
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Power consumption
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60W
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Dimensions
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440mm(W)x231mm(H)x360mm(D)
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Weight
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12.5Kg
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