Transcom Instrument Indonesia - T5230A/T5215A Vector Network Analyzer

Written By Anonymous on Kamis, 04 April 2013 | 13.52

Distributor/Agen Resmi Transcom Instruments Indonesia

T5230A/T5215 - Vector Network Analyzer

T5230A/T5215A is a high performance VNA, large frequency range, large dynamic range ,low Noise level, low trace noise, it can be widely used for microwave device measurement in wireless communication, broadcast, TV device, radar device and semiconductor.

        Large frequency range:300kHz to 3GHzT5230A, 300kHz to 1.5GHzT5215A
        Large dynamic range:>125dBIFBW=10Hz,130dB typ.
        Low noise level: <-120dBmIFBW=10Hz
        Low trace noise: 1mdB rmsIFBW=3kHz
        High measurement speed:125μs/pointIFBW=30kHz
        High effective directivity:>45dB
        Remote Control: LAN/GPIB/USB
        Very low power consumption
        “One-key-test” solution
Measurement Range
Test port connector
N-type, female
Number of test ports
Frequency range
300kHz to 3GHz/1.5GHZ(T5230A/T5215A)
Full CW frequency accuracy
Frequency resolution
Number of measurement points
2 to 10001
Measurement bandwidths
1Hz to 30kHz (with 1/1.5/2/3/5/7 steps)
Dynamic range (IF bandwidth 10 Hz)
125dB, typ.130dB
(1)use 75Ωconnectors via adapters
Measurement Speed
Measurement time per point
Source to receiver port switchover time
Typical sweep times versus number of measurement pointsIFBW 30kHz
UncorrectedStart 300 kHz, stop 10 MHz
Full two-port calibrationStart 300 kHz, stop 10 MHz
UncorrectedStart 10 MHz, stop 3 GHz
Full two-port calibrationStart 10 MHz, stop 3 GHz
Measurement Accuracy
Accuracy of transmission measurements (magnitude / phase)
+15dB to + 5dB
+ 5dB to -50dB
-50dB to -70dB
-70dB to -90dB
Accuracy of reflection measurements (magnitude / phase)
0dB -15dB
-15dB -25dB
-25dB -35dB
Trace stability
Trace noise magnitude (IF bandwidth 3 kHz)
1mdB rms
Temperature dependence (per one degree of temperature variation)
Effective System Data1
Effective directivity
45 dB
Effective source match
40 dB
Effective load match
45 dB
1applies over the temperature range of 23°C ± 5 °C after 40 minutes of warming-up, with less than 1 °C deviation from the full two-port calibration temperature, at output power of -5 dBm, and IF bandwidth 10 Hz.
Test Port Output
Match (without system error correction)
15 dB
Power range                                             
-55dBm to +10dBm
Power accuracy
Power resolution
Harmonics distortion
Non harmonics distortion
Test Port Input
Match (without system error correction)
25 dB
Damage level                                             
Damage DC voltage
Noise level (IF bandwidth 10 Hz)
Measurement Capabilities
Measured parameters
Number of measurement channels
Up to 16 independent logical channels. Each logical channel is represented on the screen as an individual channel window. A logical channel is defined by such stimulus signal settings as frequency range,number of test points, power level, etc.
Data traces
Up to 16 data traces can be displayed in each channel window. A data trace represents one of such parameters of the DUT as S-parameters,
Response in time domain, input power response.
Memory traces
Each of the 16 data traces can be saved into memory for further comparison with the current values.
Data display formats
Logarithmic magnitude, linear magnitude, phase, expanded phase, group delay, SWR, real part, imaginary part, Smith chart diagram and polar diagram.
Sweep Features
Measured points per sweep
Set by the user from 2 to 10001.
Sweep type
Linear frequency sweep, logarithmic frequency sweep, and segment frequency sweep, when the stimulus power is a fixed value; and linear power sweep when frequency is a fixed value.
Segment sweep features
A frequency sweep within several independent user-defined segments. Frequency range, number of sweep points, source power, and IF bandwidth should be set for each segment.
Source power from –55 dBm to +10 dBm with resolution of 0.05 dB. In frequency sweep mode the power slope can be set to up to 2 dB/GHz for compensation of high frequency attenuation in connection wires.
Sweep trigger
Trigger modes: continuous, single, hold. Trigger sources: internal, manual, external.
Trace Functions
Trace display
Data trace, memory trace, or simultaneous indication of data and memory traces.
Trace math
Data trace modification by math operations: addition, subtraction, multiplication or division of measured complex values and memory data.
Automatic selection of scale division and reference level value to have the trace most effectively displayed.
Electrical delay
Calibration plane moving to compensate for the delay in low-loss test setup.Compensation for electrical delay in a DUT during measurements of deviation from linear phase.
Phase offset
Phase offset defined in degrees.
Caculation and display of mean, standard deviation, and peak-to-peak deviation for a data trace.
Accuracy Enhancement
Calibration of a test setup (which includes the Analyzer, cables, and adapters)significantly increases the accuracy of measurements. Calibration allows for correction of the errors caused by imperfections in the measurement system: system directivity, source and load match, tracking and isolation.
Calibration methods
Calibration methods of various sophistication and accuracy enhancement level are available. The most accurate among them are full one-port calibration and full two-port calibration.
Reflection and transmission normalization
Magnitude and phase correction of frequency response errors for reflection or transmission measurements.
Full one-port calibration
Magnitude and phase correction of frequency response, correction of directivity, and source match errors for one-port reflection measurements.
One-path two-port calibration
Performed for reflection and one-way transmission measurements. Similar to one port calibration for reflection measurements. Magnitude and phase correction of frequency response, and correction of source match errors for transmission measurements.
Full two-port calibration
Performed for full S-parameter matrix measurement of a DUT. Magnitude and phase correction of frequency response for reflection and transmission measurements, correction of directivity, source match, load match, and isolation. Isolation calibration can be omitted.
Directivity calibration (optional)
Correction of directivity additionally to reflection normalization.
Isolation calibration (optional)
Correction of isolation additionally to transmission normalization, one-path two-port calibration, or full two-port calibration.
Error correction interpolation
When the user changes such settings as start/stop frequencies and number of sweep points, compared to the settings at the moment of calibration, interpolation or extrapolation of the calibration coefficients will be applied.
Marker Functions
Data markers
Up to 16 markers for each trace. Reference marker available for delta marker operation. Smith chart diagram supports 5 marker formats: linear magnitude/phase, log magnitude/phase, real/ imaginary, R + jX and G + jB. Polar diagram supports 3 marker formats: linear magnitude/phase, log magnitude/phase, and real/imaginary.
Reference marker
Enables indication of any maker values as relative to the reference marker.
Marker search
Search for max, min, peak, or target values on a trace.
Marker search additional features
User-definable search range. Functions of specific condition tracking or single operation search.
Setting parameters by markers
Setting of start, stop and center frequencies by the stimulus value of the marker and setting of reference level by the response value of the marker.
Marker math functions
Statistics, bandwidth.
Calculation and display of mean, standard deviation and peak-to-peak in a frequency range limited by two markers on a trace.
Determines bandwidth between cutoff frequency points for an active marker or absolute maximum. The bandwidth value, center frequency, lower frequency, higher frequency, Q value, and insertion loss are displayed.
Data Analysis
Port impedance conversion
The function of conversion of the S-parameters measured at 50 Ω port into the values, which could be determined if measured at a test port with arbitrary impedance.
The function allows to mathematically exclude from the measurement result the effect of the fixture circuit connected between the calibration plane and the DUT. This circuit should be described by an S-parameter matrix in a Touchstone file.
The function allows to mathematically simulate the DUT parameters after virtual integration of a fixture circuit between the calibration plane and the DUT. This circuit should be described by an S-parameter matrix in a Touchstone file.
S-parameter conversion
The function allows conversion of the measured S-parameters to the following parameters: reflection impedance and admittance, transmission impedance and admittance, and inverse S-parameters.
Time domain transformation
The function performs data transformation from frequency domain into response of the DUT to various stimulus types in time domain. Modeled stimulus types: bandpass, lowpass impulse, and lowpass step. Time domain span is set by the user arbitrarily from zero to maximum, which is determined by the frequency step. Windows of various forms are used for better tradeoff between resolution and level of spurious sidelobes.
Time domain gating
The function mathematically removes unwanted responses in time domain what allows for obtaining frequency response without influence from the fixture elements. The function applies reverse transformation back to frequency domain after cutting out the user-defined span in time domain. Gating filter types: bandpass or notch. For better tradeoff between gate resolution and level of spurious sidelobes the following filter shapes are available: maximum, wide, normal and minimum.
Limit Test
The limit test is a function to perform the pass/fail judgment based on the limit line you set with the limit table. In the limit test, if the upper limit or lower limit indicated by the limit line is not exceeded, the judgment result is pass; if it is exceeded, the judgment result is fail for all measurement points on the trace. Measurement points in the stimulus range with no limit line are judged as pass.
Ripple Test
The ripple test is a function for evaluating the results on a pass/fail basis based on the ripple limit, which is set using the ripple limit table. You can specify up to 12 frequency bands, which permits a test for each frequency band.
General Data
Operating temperature range
+5 to +40
Storage temperature range
-45 to +55
90% 25
Atmospheric pressure
84 to 106.7 kPa
Calibration interval
3 years
Power supply
220 ± 22 V (AC), 50 Hz
Power consumption
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